SANTA CLARA, Calif., August 23, 2006 – NEC Electronics America, Inc. today announced availability of a new operational amplifier (op amp) suitable for integrated-circuit test applications. The uPC835 junction field-effect transistor (JFET)-type op amp offers slew rates optimized for test and measurement equipment, a maximum capable capacitive load that measures four times higher than the nearest competitor product and a 3 x 3 millimeter (mm) body size thin-scaled small-outline package (TSSOP) (with a 3 x 3.49 mm outline) for increased design flexibility. This combination of features makes NEC Electronics’ uPC835 suitable for IC, memory, system-on-chip (SOC) and logic test equipment. more